| Analytical model and parameter extraction to account for the pad parasitics in RF-CMOS R Torres-Torres, R Murphy-Arteaga, JA Reynoso-Hernández IEEE Transactions on Electron Devices 52 (7), 1335-1342, 2005 | 96 | 2005 |
| MOSFET bias dependent series resistance extraction from RF measurements R Torres-Torres, RS Murphy-Arteaga, S Decoutere Electronics Letters 39 (20), 1476-1478, 2003 | 56 | 2003 |
| A review of DC extraction methods for MOSFET series resistance and mobility degradation model parameters A Ortiz-Conde, A Sucre-González, F Zárate-Rincón, R Torres-Torres, ... Microelectronics Reliability 69, 1-16, 2017 | 49 | 2017 |
| A method to determine the gate bias-dependent and gate bias-independent components of MOSFET series resistance from S-parameters E Torres-Rios, R Torres-Torres, G Valdovinos-Fierro, EA Gutierrez-D IEEE transactions on electron devices 53 (3), 571-573, 2006 | 49 | 2006 |
| Extracting characteristic impedance in low-loss substrates R Torres-Torres Electronics Letters 47 (3), 1, 2011 | 48 | 2011 |
| Stack-up and routing optimization by understanding micro-scale PCB effects G Romo, C Nwachukwu, R Torres-Torres, SW Baek, M Schauer Proc. DesignCon, 758-782, 2011 | 32 | 2011 |
| MOSFET gate resistance determination R Torres-Torres, RS Murphy-Arteaga, S Decoutere Electronics Letters 39 (2), 1, 2003 | 27 | 2003 |
| Straightforward determination of small-signal model parameters for bulk RF-MOSFETs R Torres-Torres, R Murphy-Arteaga Proceedings of the Fifth IEEE International Caracas Conference on Devices …, 2004 | 26 | 2004 |
| Impedance matching of traces and multilayer via transitions for on-package links G Hernandez-Sosa, R Torres-Torres, A Sanchez IEEE Microwave and wireless components letters 21 (11), 595-597, 2011 | 25 | 2011 |
| Accurate modeling of gate tunneling currents in Metal-Insulator-Semiconductor capacitors based on ultra-thin atomic-layer deposited Al2O3 and post-metallization annealing J Molina-Reyes, H Uribe-Vargas, R Torres-Torres, PG Mani-Gonzalez, ... Thin Solid Films 638, 48-56, 2017 | 23 | 2017 |
| A DC method to extract mobility degradation and series resistance of multifinger microwave MOSFETs A Sucre-González, F Zárate-Rincón, A Ortiz-Conde, R Torres-Torres, ... IEEE Transactions on Electron Devices 63 (5), 1821-1826, 2016 | 21 | 2016 |
| An approach for quantifying the conductor and dielectric losses in PCB transmission lines R Torres-Torres, VH Vega-González 2009 IEEE 18th Conference on Electrical Performance of Electronic Packaging …, 2009 | 20 | 2009 |
| Characterization of electrical transitions using transmission line measurements R Torres-Torres, G Hernández-Sosa, G Romo, A Sánchez IEEE Transactions on Advanced Packaging 32 (1), 45-52, 2009 | 19 | 2009 |
| Modeling and parameter extraction for the metal surface roughness loss effect on substrate integrated waveguides from S-parameters G Méndez-Jerónimo, SC Sejas-García, R Torres-Torres IEEE Transactions on Microwave Theory and Techniques 66 (2), 875-882, 2017 | 18 | 2017 |
| Impact of technology scaling on the input and output features of RF-MOSFETs: effects and modeling R Torres-Torres, R Murphy-Arteaga, E Augendre, S Decoutere ESSDERC'03. 33rd Conference on European Solid-State Device Research, 2003 …, 2003 | 17 | 2003 |
| Using S-parameter measurements to determine the threshold voltage, gain factor, and mobility degradation factor for microwave bulk-MOSFETs G Álvarez-Botero, R Torres-Torres, R Murphy-Arteaga Microelectronics Reliability 51 (2), 342-349, 2011 | 16 | 2011 |
| Experimental characterization of frequency-dependent series resistance and inductance for ground shielded on-chip interconnects DM Cortés-Hernández, R Torres-Torres, O Gonzalez-Diaz, ... IEEE Transactions on Electromagnetic Compatibility 56 (6), 1567-1575, 2014 | 15 | 2014 |
| Characterization of Hot-Carrier-Induced RF-MOSFET Degradation at Different Bulk Biasing Conditions From -Parameters F Zárate-Rincón, D Garcia-Garcia, VH Vega-Gonzalez, R Torres-Torres, ... IEEE Transactions on Microwave Theory and Techniques 64 (1), 125-132, 2015 | 14 | 2015 |
| Modeling the impact of multi-fingering microwave MOSFETs on the source and drain resistances F Zárate-Rincón, RS Murphy-Arteaga, R Torres-Torres, A Ortiz-Conde, ... IEEE Transactions on Microwave Theory and Techniques 62 (12), 3255-3261, 2014 | 14 | 2014 |
| Modeling resonances in transmission lines fabricated over woven fiber substrates R Torres-Torres, G Romo, M Schauer, C Nwachukwu, SW Baek IEEE transactions on microwave theory and techniques 61 (7), 2558-2565, 2013 | 14 | 2013 |
