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Co-authors
- Jinyoung OhSamsung Research AmericaVerified email at samsung.com
- Jeongho YeoSamsung ElectronicsVerified email at samsung.com
- Hyoung-ju JiPrincipal Engineer of Samsung Electronics. LtdVerified email at samsung.com
- Shin CheolkyuAssistant Professor, Hallym UniversityVerified email at hallym.ac.kr
- Youngwoo KwakInterDigital, Inc.Verified email at InterDigital.com
- Donghan KimSamsung ElectronicsVerified email at samsung.com
- Younsun KimSamsungVerified email at samsung.com
- Heecheol YangAssistant Professor, Chungnam National UniversityVerified email at cnu.ac.kr
- Md Saifur RahmanSamsung Research America - DallasVerified email at samsung.com
- Young Han NamSamsungVerified email at samsung.com
- Hyojin LeeQualcomm Technologies Inc.Verified email at postech.ac.kr
- Seungri JinSamsung ElectronicsVerified email at samsung.com
- Moon-Sik LeeElectronics and Telecommunications Research Institute (ETRI)Verified email at etri.re.kr
- Jinkyu KangAssistant Professor, Myongji UniversityVerified email at mju.ac.kr
- Lee JuhoSamsung ElectronicsVerified email at samsung.com
- Hongbo SiSamsung Research AmericaVerified email at utexas.edu
- Boon Loong NgSamsung Research AmericaVerified email at samsung.com
- Kyungsik MinThe University of Suwon, Assistant ProfessorVerified email at suwon.ac.kr
- Taehyoung KimKookmin University, Assistant Professor