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Co-authors
- Wei YuUniversity of TorontoVerified email at ece.utoronto.ca
- Narayan B. MandayamDistinguished Professor of Electrical and Computer EngineeringVerified email at winlab.rutgers.edu
- Ivan SeskarChief Technologist & Director, IT, WINLAB, Departmant of ECE, Rutgers UniversityVerified email at winlab.rutgers.edu
- Ratnesh KumbhkarResearch Engineer, Intel CorporationVerified email at winlab.rutgers.edu
- Teng Joon LimUniversity of SydneyVerified email at sydney.edu.au
- Sastry KompellaU.S. Naval Research LaboratoryVerified email at vt.edu
- Mohammad HajimirsadeghiData Science Manager, Engage3Verified email at engage3.com
- Walid SaadProfessor, Electrical and Computer Engineering, Virginia TechVerified email at vt.edu
- Srikrishna BhashyamElectrical Engineering, IIT MadrasVerified email at ee.iitm.ac.in
- Andrew ThangarajProfessor, Electrical Engineering, Indian Institute of Technology Madras, ChennaiVerified email at ee.iitm.ac.in